Serial PCM Technical Notes

Type Secure Title & Description ID# Updated Size
Thermal Applications:  Defines a general method and criteria for measuring and ensuring that Micron components and modules do not exceed the maximum allowable temperature TN-00-08 05/2010 252.18 KB
Moisture Absorption in Plastic Packages:  Describes shipping procedures for preventing memory devices from absorbing moisture and recommendations for baking devices exposed to excessive moisture TN-00-01 02/2010 87.26 KB
Accelerate Design Cycles with Simulation Models:  Micron supplies the tools and guidelines necessary to verify new designs prior to layout. This technical note discusses software model support, signal integrity optimization, and logic circuit design. TN-00-09 02/2010 206.91 KB
Comparing P5Q Serial PCM and NOR Flash SPI Memory:  Comparing the features of the 128Mb P5Q serial PCM and NOR Flash SPI memory devices enables users to migrate applications from NOR Flash memory to P5Q serial PCM memory. AN310052 11/2011 146.41 KB
Software Device Drivers for the Micron P5Q PCM Device:  This technical note describes the C library source code for the Micron P5Q phase change memory (PCM) device using the Micron software device driver. TN-13-04 03/2011 302.12 KB
Extending PCM Temperature and Data Retention Ranges: Software Refresh Procedure:  This technical note describes a software procedure for refreshing data in Micron® P5Q serial phase change memory (PCM) and P8P parallel PCM devices to enable usage beyond current data sheet specifications. TN-13-07 06/2011 540.15 KB
Extending 90nm PCM Endurance from 1 Million WRITE Cycles Up to 1 Billion Cycles:  This technical note outlines a software solution called the parameter manager, which is used to increase the WRITE cycles for Micron's phase change memory (PCM) well beyond its standard endurance specifications. TN-13-09 11/2011 441.71 KB

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Serial PCM